5 research outputs found

    Radio Frequency Transistors and Circuits Based on CVD MoS<sub>2</sub>

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    We report on the gigahertz radio frequency (RF) performance of chemical vapor deposited (CVD) monolayer MoS<sub>2</sub> field-effect transistors (FETs). Initial DC characterizations of fabricated MoS<sub>2</sub> FETs yielded current densities exceeding 200 μA/μm and maximum transconductance of 38 μS/μm. A contact resistance corrected low-field mobility of 55 cm<sup>2</sup>/(V s) was achieved. Radio frequency FETs were fabricated in the ground–signal–ground (GSG) layout, and standard de-embedding techniques were applied. Operating at the peak transconductance, we obtain short-circuit current-gain intrinsic cutoff frequency, <i>f</i><sub>T</sub>, of 6.7 GHz and maximum intrinsic oscillation frequency, <i>f</i><sub>max</sub>, of 5.3 GHz for a device with a gate length of 250 nm. The MoS<sub>2</sub> device afforded an extrinsic voltage gain <i>A</i><sub>v</sub> of 6 dB at 100 MHz with voltage amplification until 3 GHz. With the as-measured frequency performance of CVD MoS<sub>2</sub>, we provide the first demonstration of a common-source (CS) amplifier with voltage gain of 14 dB and an active frequency mixer with conversion gain of −15 dB. Our results of gigahertz frequency performance as well as analog circuit operation show that large area CVD MoS<sub>2</sub> may be suitable for industrial-scale electronic applications
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